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ISOM HILMI

Universitas Ahmad Dahlan S1 - Fisika SINTA ID : 6830870
393
SINTA Score Overall
36
SINTA Score 3Yr
393
Affil Score
36
Affil Score 3Yr
Latest number of Publication and Citations
Fabrication of pbs films for air mass filter of solar simulator
Authors : I Hilmi, DY Kusuma, H Soetedjo, Q Hidayah, U Salamah Jurnal Teknosains 13 (2), 109-116, 2024
2024 0 cited
Nanoscale Characterization of Phase-Change Memory Thin Films and Heterostructures by Aberration-Corrected STEM
Authors : A Lotnyk, B Rauschenabach, I Hilmi, T Dankwort, M Behrens, L Kienle roperties P-2021, 2021
2021 0 cited
Temperature dependent evolution of local structure in chalcogenide-based superlattices
Authors : A Lotnyk, I Hilmi, M Behrens, B Rauschenbach Applied Surface Science 536, 147959, 2021
2021 48 cited
Influence of substrate dimensionality on the growth mode of epitaxial 3D-bonded GeTe thin films: From 3D to 2D growth
Authors : I Hilmi, A Lotnyk, JW Gerlach, P Schumacher, B Rauschenbach Materials & Design 168, 107657, 2019
2019 27 cited
Atomic-scale observation of defects motion in van der Waals layered chalcogenide based materials
Authors : A Lotnyk, T Dankwort, I Hilmi, L Kienle, B Rauschenbach Scripta Materialia 166, 154-158, 2019
2019 18 cited
In situ observations of the reversible vacancy ordering process in van der Waals-bonded Ge–Sb–Te thin films and GeTe–Sb 2 Te 3 superlattices
Authors : A Lotnyk, T Dankwort, I Hilmi, L Kienle, B Rauschenbach Nanoscale 11 (22), 10838-10845, 2019
2019 53 cited
Ultrafast interfacial transformation from 2D-to 3D-bonded structures in layered Ge–Sb–Te thin films and heterostructures
Authors : M Behrens, A Lotnyk, JW Gerlach, I Hilmi, T Abel, P Lorenz, ... Nanoscale 10 (48), 22946-22953, 2018
2018 44 cited
Van der Waals interfacial bonding and intermixing in GeTe-Sb2Te3-based superlattices
Authors : A Lotnyk, I Hilmi, U Ross, B Rauschenbach Nano Research 11, 1676-1686, 2018
2018 77 cited
Research update: Van-der-Waals epitaxy of layered chalcogenide Sb2Te3 thin films grown by pulsed laser deposition
Authors : I Hilmi, A Lotnyk, JW Gerlach, P Schumacher, B Rauschenbach APL Materials 5 (5), 2017
2017 43 cited
Atomic structure and dynamic reconfiguration of layered defects in van der Waals layered Ge-Sb-Te based materials
Authors : A Lotnyk, U Ross, T Dankwort, I Hilmi, L Kienle, B Rauschenbach Acta Materialia 141, 92-96, 2017
2017 70 cited
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Summary

Article Quartile
Research Output
  Scopus GScholar WOS
Article 10 18 0
Citation 386 460 0
Cited Document 10 13 0
H-Index 10 11
i10-Index 10 11
G-Index 0 1
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